US Patent Issued to COXEM on Feb. 4 for "Detachable column unit of scanning electron microscope, and method for providing the same" (South Korean Inventor)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,933, issued on Feb. 4, was assigned to COXEM Co. LTD (Daejeon, South Korea).

"Detachable column unit of scanning electron microscope, and method for providing the same" was invented by Jun Hee Lee (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a detachable column unit of a scanning electron microscope, and a method of providing the same, wherein the detachable column unit allows the column to be attached to and detached from the sample installation unit, and allows a simple correction related to the column, beam distortion, replacement of consumables, etc. Since problems related to the column are s...