US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Sept. 2 for "Method and apparatus for detecting defect on surface of cell" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,406,349, issued on Sept. 2, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Method and apparatus for detecting defect on surface of cell" was invented by Hongji Sun (Ningde, China), Fei Chen (Ningde, China) and Guannan Jiang (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and apparatus for detecting a defect on a surface of a cell, including: obtaining an initial image of the surface of the cell by using an image acquisition unit; preprocessing the initial image to obtain at least one image to be detected of the surface of the cell; and inputting the at least one image to be detected into a defect de...