US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Oct. 14 for "Measurement method and apparatus, and radiation measuring device" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,778, issued on Oct. 14, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Measurement method and apparatus, and radiation measuring device" was invented by Liangjie Yan (Ningde, China) and Xing Wang (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method includes determining a measured mass parameter of a workpiece being measured based on radiation intensity of rays that have passed through the workpiece being measured; and correcting the measured mass parameter by using a displacement curve function of the workpiece being measured in a measurement environment, to obtain the corrected mass para...