US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Nov. 4 for "Detection method, surface density device, detection means, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,926, issued on Nov. 4, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Detection method, surface density device, detection means, and storage medium" was invented by Qiangjun Wang (Ningde, China), Jingdong Zhang (Ningde, China), Bingyang Zhan (Ningde, China), Zhihui Zhen (Ningde, China) and Weigang Chen (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection method includes obtaining, during operation of a surface density device, a first current pose of a radiation source of the surface density device and a second current pose of a ionization chamber of the surface density device; ascertaining a first ...