US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Dec. 2 for "Insulation sampling circuit and control method therefor, voltage withstand test method, and power consuming device" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,271, issued on Dec. 2, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Insulation sampling circuit and control method therefor, voltage withstand test method, and power consuming device" was invented by Xingchang Wang (Ningde, China), Wei Tian (Ningde, China), Zhiwei Yan (Ningde, China), Hang Ma (Ningde, China) and Fangyou Lu (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses an insulation sampling circuit. The insulation sampling circuit includes: a first sampling circuit composed of a first sampling module, a first resistor, and a first switch module; a second sampling circ...