US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on Aug. 12 for "Gap inspection apparatus and gap inspection method" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,737, issued on Aug. 12, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong).

"Gap inspection apparatus and gap inspection method" was invented by Fenglin Zhang (Ningde, China), Jianlin Liu (Ningde, China), Shaoteng Ren (Ningde, China), Siyuan Qi (Ningde, China) and Zhimeng Shi (Ningde, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A gap inspection apparatus and a gap inspection method are disclosed. The gap inspection apparatus is configured for a wound battery cell, where in a height direction of the wound battery cell. The gap inspection apparatus includes: an X-ray source and an X-ray detector and a bearing mechani...