ALEXANDRIA, Va., June 6 -- United States Patent no. 12,281,967, issued on April 22, was assigned to Commissariat A L'Energie Atomique et aux Energies Alternatives (Paris).

"Method for detecting a defect in a structure of a device" was invented by Olivier Mesnil (Gif-sur-Yvette, France) and Guillemette Ribay (Gif-sur-Yvette, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a defect in a structure of a device includes generating, only using the device, a low-frequency signal that makes the structure vibrate, generating a high-frequency signal in the structure, and measuring a vibratory signal caused by the generated low-frequency and high-frequency signals at the same time then adap...