US Patent Issued to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, UNIVERSITE PARIS-SACLAY on Aug. 12 for "Surface analysis system comprising a pulsed electron source" (French, German Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,901, issued on Aug. 12, was assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES (Paris), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris) and UNIVERSITE PARIS-SACLAY (Gif-sur-Yvette, France).

"Surface analysis system comprising a pulsed electron source" was invented by Daniel Comparat (Paris), Nicholas Barrett (Gif sur Yvette, France), Lionel Amiaud (Palaiseau, France), Yan Picard (Breuillet, France), Anne Lafosse (Paris), Raphael Hahn (Orsay, France), Olena Fedchenko (Mainz, France) and Gerd Schoenhense (Mainz, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for performing surface analysis on a material, i...