US Patent Issued to Cohu on Oct. 28 for "Test socket for and a method of testing electronic components, in particular high-power semiconductor components" (German Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,297, issued on Oct. 28, was assigned to Cohu GmbH (Kolbermoor, Germany).

"Test socket for and a method of testing electronic components, in particular high-power semiconductor components" was invented by Stefan Engelbrecht (Bruckmuhl, Germany), Johann Potzinger (Fischbachau, Germany), Christoph Mederer (Bad Feilnbach, Germany) and Markus Wagner (Kolbermoor, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket for and a method of testing electronic components, in particular high-power semiconductor components comprise: a plurality of contact elements, being adapted to contact to the electronic component; a holder block for holding and...