ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,987, issued on Dec. 9, was assigned to Cognex Corp. (Natick, Mass.).
"Calibration-less structured light measurement" was invented by Ivan Bachelder (Hillsborough, N.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "The techniques described herein relate to methods, apparatus, and computer readable media for measuring object characteristics by interpolating the object characteristics using stored associations. A first image of at least part of a ground surface with a first representation of a laser line projected onto the ground surface from a first pose is received. A first association between a known value of the characteristic of the ground surface...