US Patent Issued to CMP Scientific on June 10 for "Systems and methods for analyzing samples" (Nevada, California, New York Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,327,717, issued on June 10, was assigned to CMP Scientific Corp (Brooklyn, N.Y.).

"Systems and methods for analyzing samples" was invented by Paul Nurmi (Gardnerville, Nev.), Joshua Wiley (Auburn, Calif.) and Qiangwei Xia (Brooklyn, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output a plurality of particles, a tube having a central axis, and a skimmer. In some embodiments, the skimmer may include an aperture arranged to receive the one or more charged particles deflected by a deflector and a contact surface comprisi...