US Patent Issued to CiTEX Holding on Sept. 16 for "Method for calibrating a THz measuring device and extrusion and measurement system" (Pennsylvania Inventor)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,494, issued on Sept. 16, was assigned to CiTEX Holding GmbH (Melle, Germany).

"Method for calibrating a THz measuring device and extrusion and measurement system" was invented by Andrej Unruh (Bird in Hand, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method for calibrating a stationary THz measuring device which measures geometric properties of a profile by means of one or more THz sensors during an extrusion of the profile, comprising at least one or more steps."

The patent was filed on Jan. 5, 2023, under Application No. 18/093,352.

*For further information, including images, charts and tables, please ...