US Patent Issued to CiTEX Holding on March 4 for "THz measuring method and THz measuring device for detecting a material flow" (German Inventor)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,766, issued on March 4, was assigned to CiTEX Holding GmbH (Melle, Germany).

"THz measuring method and THz measuring device for detecting a material flow" was invented by Marius Thiel (Osnabruck, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a material flow comprises: generating a THz beam with a THz sensor, guiding the THz beam through a material flow along at least one first optical axis, reflecting the THz beam with at least one reflector mirror detecting the reflected THz reflection beam and generating a signal amplitude, determining a reflector peak in the signal amplitude corresponding to the reflector mirror, e...