US Patent Issued to CITEX HOLDING on March 18 for "THz measurement method and THz measurement device for measuring a measurement object" (German Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,350, issued on March 18, was assigned to CITEX HOLDING GMBH (Melle, Germany).

"THz measurement method and THz measurement device for measuring a measurement object" was invented by Marius Thiel (Osnabruck, Germany) and Ralph Klose (Melle, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a THz measuring method for measuring a measured object (18), including the steps: calibration measurement with emitting a THz transmission beam (5) through an empty measuring space (6) towards a main reflector (3) along an optical axis (A) and reflection of the THz transmission beams (5) at the main reflector back to the THz-Transceive...