US Patent Issued to Cisco Technology on July 8 for "Optical wafer-scale photodiode bandwidth measurement system" (California Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,353,007, issued on July 8, was assigned to Cisco Technology Inc. (San Jose, Calif.).

"Optical wafer-scale photodiode bandwidth measurement system" was invented by Attila Mekis (Carlsbad, Calif.) and Gianlorenzo Masini (Carlsbad, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments herein described an optical system for testing the bandwidth of a photodiode (PD) in a photonic integrated circuit (PIC). In one embodiment, a first optical signal is provided to bias one or more PDs in the PIC which generate a DC bias (e.g., DC voltage) across the PD whose bandwidth is being tested. A second optical signal is directed to the PD being tested, there...