US Patent Issued to CIQTEK on March 25 for "Electron detection device and scanning electron microscope" (Chinese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,261,016, issued on March 25, was assigned to CIQTEK Co. LTD. (Anhui, China).

"Electron detection device and scanning electron microscope" was invented by Da Yin (Anhui, China), Tianjun Li (Anhui, China), Bin Sun (Anhui, China), Wei Zhang (Anhui, China), Feng Cao (Anhui, China) and Yu He (Anhui, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an electron detection device and a scanning electron microscope. The electron detection device includes: a reflective energy analyzer including first and second control electrodes that are sequentially arranged in an incidence direction of an electron beam; a first detector disposed at a side of t...