ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,949, issued on Nov. 11, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan, Taiwan).
"Cantilever probe card device and light absorption probe" was invented by Hao-Yen Cheng (Taoyuan, Taiwan), Rong-Yang Lai (Taoyuan, Taiwan), Chao-Hui Tseng (New Taipei, Taiwan) and Wei-Jhih Su (Taichung, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A light absorption probe includes an arm segment, a main segment located at one side of the arm segment, a testing segment connected to another side of the arm segment, and a light absorption coating layer. The main segment has a soldering end portion and an extending end portion respectively located ...