US Patent Issued to CHUNG ANG UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION on Oct. 21 for "Method for generating deformed images for anomaly detection and computing device for performing the same" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,450,791, issued on Oct. 21, was assigned to CHUNG ANG UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION (Seoul, South Korea).

"Method for generating deformed images for anomaly detection and computing device for performing the same" was invented by Jong Won Choi (Gyeongsangnam-do, South Korea), Min Gyu Lee (Seoul, South Korea), Do Hee Kim (Seoul, South Korea) and Yu Jeong Oh (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for generating deformed images includes receiving an original image including a non-defective object and augmenting the original image into a plurality of images, receiving the plurality of augmented...