US Patent Issued to Chongqing University on Dec. 30 for "Testing device and method for simulating coalbump of passing through fault" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,447, issued on Dec. 30, was assigned to Chongqing University (Shapingba, China).

"Testing device and method for simulating coalbump of passing through fault" was invented by Shoujian Peng (Chongqing, China), Jiang Xu (Chongqing, China), Qingfeng Xu (Chongqing, China), Liang Cheng (Chongqing, China), Li Jia (Chongqing, China), Bin Zhou (Chongqing, China), Yi'an Chen (Chongqing, China), Feng Jiao (Chongqing, China), Yan Yang (Chongqing, China), Hailin Yang (Chongqing, China), Qingqing Gan (Chongqing, China) and Xiaomei Wang (Chongqing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device for simulating coalbump includes a testing cham...