ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,222,380, issued on Feb. 11, was assigned to CHINA NATIONAL MACHINE TOOL QUALITY SUPERVISION TESTING CENTER (Beijing) and SHANDONG JIANZHU UNIVERSITY (Jinan, China).

"Electromagnetic immunity test system and control method thereof" was invented by Zuguang Huang (Beijing), Shuai Ji (Beijing), Jinjiang Wang (Beijing), Ruijuan Xue (Beijing), Tianliang Hu (Beijing), Hepeng Ni (Beijing) and Chengrui Zhang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic immunity test system includes a data acquisition and control device, a linear module, an electromagnetic disturbance simulator, and an upper computer. The data acquisition and control...