US Patent Issued to CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION NO. 24 RESEARCH INSTITUTE on Nov. 18 for "Method for calibrating analog-to-digital converter" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,650, issued on Nov. 18, was assigned to CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION NO. 24 RESEARCH INSTITUTE (Chongqing, China).

"Method for calibrating analog-to-digital converter" was invented by Ting Li (Chongqing, China), Ruzhang Li (Chongqing, China), Yong Zhang (Chongqing, China), Yabo Ni (Chongqing, China), Chao Chen (Chongqing, China), Liang Li (Chongqing, China), Huaiqiang Yu (Chongqing, China), Dongbing Fu (Chongqing, China), Jianan Wang (Chongqing, China) and Guangbing Chen (Chongqing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for calibrating an analog-to-digital converter includes the following steps: conducting a...