US Patent Issued to China Electronics Reliability And Environmental Testing Institute on July 1 for "Method and apparatus for fault isolation, computer device, medium and program product" (Chinese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,093, issued on July 1, was assigned to China Electronics Reliability And Environmental Testing Institute (China).

"Method and apparatus for fault isolation, computer device, medium and program product" was invented by Chao Pang (Guangzhou, China), Yiqiang Ni (Guangzhou, China), Liang He (Guangzhou, China), Shizheng Yang (Guangzhou, China) and Yinle Li (Guangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for fault isolation includes: acquiring a thermal imaging picture of a surface of a to-be-tested chip, the thermal imaging picture being obtained by scanning the to-be-tested chip to which a test signal is applied through an infra...