US Patent Issued to Chengdu University of Technology on May 13 for "Study method for chlorite growth pattern based on in-situ high-precision observation means" (Chinese Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,292, issued on May 13, was assigned to Chengdu University of Technology (Chengdu, China).

"Study method for chlorite growth pattern based on in-situ high-precision observation means" was invented by Laixing Cai (Chengdu, China), Weixue Guo (Chengdu, China), Chengfang Yuan (Chengdu, China), Tian Yang (Chengdu, China), Yaohui Dong (Chengdu, China) and Yuhang Li (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention belongs to the technical field of petroleum and natural gas exploration and development, and specifically relates to a study method for chlorite growth pattern based on an in-situ high-precision observation mea...