ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,365, issued on July 22, was assigned to CHECKPOINT SYSTEMS INC. (Thorofare, N.J.).
"Inline testing of RFID inlays" was invented by Thomas Craig Weakley (Simpsonville, S.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure relates to inline testing of RFID inlays. A test system includes a test interface without moving parts and a marking device. The test interface an array of antennas, a radio frequency identification (RFID) reader to interrogate RFID inlays to be tested; and a circuit configured to selectively connect the RFID reader to the antenna in the array of antenna. The test interface performs a primary scan of all of the RFID in...