US Patent Issued to CHANGXIN MEMORY TECHNOLOGIES on Sept. 30 for "Circuit for calibration control, electronic device and method for calibration control" (Chinese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,213, issued on Sept. 30, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China).

"Circuit for calibration control, electronic device and method for calibration control" was invented by Kai Tian (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit for calibration control includes an off-chip calibration circuit and a mode switching circuit, and the off-chip calibration circuit includes a preprocessing circuit and a mapping circuit. The preprocessing circuit is configured to receive a current set of environmental parameters, decode the current set of environmental parameters and output parameter decoding signals. The mappi...