US Patent Issued to CHANGXIN MEMORY TECHNOLOGIES on March 18 for "Signal detection system for duty cycle testing and memory detection method" (Chinese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,943, issued on March 18, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China).

"Signal detection system for duty cycle testing and memory detection method" was invented by Jianyong Qin (Hefei, China), Jianni Li (Hefei, China) and Zhonglai Liu (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A signal detection system and a memory detection method are provided. The system includes a signal generator, generating a reference test signal based on an external parameter, the reference test signal being a clock signal satisfying a preset duty cycle, where a duty cycle test is performed on the reference test signal based on a test ci...