US Patent Issued to CHANGXIN MEMORY TECHNOLOGIES on June 3 for "Anti-fuse circuit and anti-fuse unit programming state real-time verification" (Chinese Inventor)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,460, issued on June 3, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China).

"Anti-fuse circuit and anti-fuse unit programming state real-time verification" was invented by Jiarui Zhang (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosed anti-fuse circuit includes: an anti-fuse unit; a programming circuit, configured to program the anti-fuse unit according to a programming signal; a verification unit, including a first input terminal, a second input terminal and a first output terminal, the programming signal of the anti-fuse unit is the input signal of the first input terminal, and the data signal stored in the ant...