US Patent Issued to Changxin Memory Technologies on June 24 for "Delay-locked loop, delay locking method, clock synchronization circuit, and memory" (Chinese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,341,515, issued on June 24, was assigned to Changxin Memory Technologies Inc. (Hefei, China).

"Delay-locked loop, delay locking method, clock synchronization circuit, and memory" was invented by Siman Li (Hefei, China) and Yoonjoo Eom (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a delay-locked loop (DLL), a delay locking method, a clock synchronization circuit, and a memory. The DLL includes: a frequency division module, configured to receive an input clock signal, perform frequency division on the input clock signal, and output an intermediate clock signal; a first adjustable delay line, configured to receive the intermedia...