US Patent Issued to CHANGXIN MEMORY TECHNOLOGIES on July 29 for "Method and device for detecting layout of integrated circuit, and storage medium" (Chinese Inventor)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,571, issued on July 29, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China).

"Method and device for detecting layout of integrated circuit, and storage medium" was invented by Miaomiao Chen (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a layout of an integrated circuit includes: a finger structure is determined in the layout, the finger structure including at least one upper connection source-drain terminal and at least one upper connected via, the at least one upper connected source-drain terminal being electrically connected to an upper metal line through the at least one upper connected via; a nu...