US Patent Issued to CHANGXIN MEMORY TECHNOLOGIES on April 22 for "Pulse generator, error check and scrub (ECS) circuit and memory" (Chinese Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,345, issued on April 22, was assigned to CHANGXIN MEMORY TECHNOLOGIES INC. (Hefei, China).

"Pulse generator, error check and scrub (ECS) circuit and memory" was invented by Zequn Huang (Hefei, China) and Kai Sun (Hefei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pulse generator, an Error Check and Scrub (ECS) circuit and a memory are provided. The pulse generator includes: a delay circuit configured to receive an ECS command signal, perform delay processing on the ECS command signal, and output a delay command signal, the delay between the ECS command signal and the delay command signal being a first preset value; and a latch circuit conf...