ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,602, issued on Aug. 19, was assigned to CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES (Jilin, China).
"Littrow grating interferometry device and use thereof" was invented by Wenhao Li (Changchun, China), Wenyuan Zhou (Changchun, China), Zhaowu Liu (Changchun, China), Yujia Sun (Changchun, China) and Lin Liu (Changchun, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to the technical field of grating interferometry, in particular to a Littrow grating interferometry device and a use thereof. The device comprises: a two-frequency orthogonal polarization light source, a polarizing beam ...