US Patent Issued to CESKE VYSOKE UCENI TECHNICKE V PRAZE on March 18 for "Method of examining a sample in an atomic force microscope using attractive tip-to-sample interaction" (Czech Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,539, issued on March 18, was assigned to CESKE VYSOKE UCENI TECHNICKE V PRAZE (Prague).

"Method of examining a sample in an atomic force microscope using attractive tip-to-sample interaction" was invented by Egor Ukraintsev (Kladno, Czech Republic) and Bohuslav Rezek (Prague).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of examining a sample in an atomic force microscope including at least one probe, each probe including at least one cantilever and at least one tip includes carrying out a negative setpoint setting procedure, wherein the negative setpoint SCD is set as a negative real number, an approaching procedure including: above at le...