US Patent Issued to Centaur Analytics on Jan. 27 for "Systems and methods for post-harvest crop quality management" (Greek, American Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,489, issued on Jan. 27, was assigned to Centaur Analytics Inc. (Ventura, Calif.).

"Systems and methods for post-harvest crop quality management" was invented by Efstathios Kaloudis (Athens, Greece), Sotirios Bantas (Volos, Greece), Vasileios Sotiroudas (Salonika, Greece) and Ronald E. Ham (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of systems and approaches for managing post-harvest crop quality and pests are described. Such a system may include a plurality of edge devices each comprising sensor components and collectively forming a mesh network, for measuring the local physical environment within stored crops and, for ...