US Patent Issued to CELL ENVIRONMENT on March 25 for "High-throughput method for detecting chromosomal aberrations and/or telomere aberrations" (French Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,258,621, issued on March 25, was assigned to CELL ENVIRONMENT (Champigny-sur-Marne, France).

"High-throughput method for detecting chromosomal aberrations and/or telomere aberrations" was invented by Radhia M'Kacher (Champigny sur Marne, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A high throughput method for detecting chromosomal aberrations and/or telomere aberrations using a biological sample of 150 MuL to 200 MuL including preparing a cytogenetic slide from the sample in a microplate, the mitotic index in the cytogenetic slide being 3 times higher on average than the conventional procedure of culturing cells in flasks with 10 to 20 mL of ...