US Patent Issued to Casi Vision Technology (Beijing), Casi Vision Technology (Luoyang) on April 29 for "Ultra-micro defect detection apparatus and detection method thereof" (Chinese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,288,318, issued on April 29, was assigned to Casi Vision Technology (Beijing) Co. Ltd. (Beijing) and Casi Vision Technology (Luoyang) Co. Ltd. (Luoyang, China).

"Ultra-micro defect detection apparatus and detection method thereof" was invented by Feng Lei (Henan, China), Wujie Zhang (Henan, China), Xiaoyun Lv (Henan, China) and Qian Zhang (Henan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses an ultra-micro defect detection apparatus and a detection method thereof. The apparatus includes an imaging module, a light source module, a filtering module, and a mounting platform; the imaging module further includes a came...