US Patent Issued to CARL ZEISS X-RAY MICROSCOPY on Sept. 23 for "Spectrally and spatially resolved x-ray and particle detection system" (American, German Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,419,591, issued on Sept. 23, was assigned to CARL ZEISS X-RAY MICROSCOPY INC. (Dublin, Calif.).

"Spectrally and spatially resolved x-ray and particle detection system" was invented by Xiaochao Xu (Pleasanton, Calif.) and Christoph Graf Vom Hagen (Schwaebisch Gmuend, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection system for an x-ray or charged particle imaging system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray/charged particle projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical micro...