US Patent Issued to Carl Zeiss X-ray Microscopy on Jan. 28 for "Reflection target X-ray source with steered beam on target" (California Inventor)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,213,238, issued on Jan. 28, was assigned to Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.).

"Reflection target X-ray source with steered beam on target" was invented by Claus Flachenecker (Hayward, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for controlling an x-ray source comprises generating an electron beam for striking the target to generate x-rays and steering the electron beam to a desired location on the target using a first and a second steering system distributed along a flight tube. In this way, the beam can be steering to the desired location while also passing through the center of a focusing lens to maintain optimal be...