US Patent Issued to CARL ZEISS X-RAY MICROSCOPY on Dec. 2 for "3D particle analysis and separation using dual seeding" (California Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,194, issued on Dec. 2, was assigned to CARL ZEISS X-RAY MICROSCOPY INC. (Dublin, Calif.).

"3D particle analysis and separation using dual seeding" was invented by Evan Drake (Dublin, Calif.) and Matthew Andrew (Livermore, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multi scale material segmentation method is provided that creates markers to identify unique particles, for small and large particles independently, and then separately processes those markers."

The patent was filed on Oct. 20, 2022, under Application No. 18/048,183.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/np...