US Patent Issued to Carl Zeiss on July 29 for "Device and method for measuring a surface topography, and calibration method" (American, German Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,347, issued on July 29, was assigned to Carl Zeiss AG (Oberkochen, Germany).

"Device and method for measuring a surface topography, and calibration method" was invented by Lars Omlor (Pleasanton, Calif.) and Carsten Glasenapp (Oberkochen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and a device for measuring the topography and/or the gradients and/or the curvature of an optically active surface of an object are disclosed. The device allows the object to be arranged in a receiving region with a contact surface for contact with the object. Inside the device, there is a plurality of point light sources that provide light that is ref...