US Patent Issued to Carl Zeiss MultiSEM on May 13 for "System comprising a multi-beam particle microscope and method for operating the same" (German Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,462, issued on May 13, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany).

"System comprising a multi-beam particle microscope and method for operating the same" was invented by Dirk Zeidler (Oberkochen, Germany), Nico Kaemmer (Koenigsbronn, Germany) and Christian Crueger (Gerstetten, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a multi-beam particle microscope for imaging a 3D sample layer by layer, and a computer system with a multi-tier architecture is disclosed. The multi-tier architecture can allow for an optimized image processing by gradually reducing the amount of parallel processing speed when data ex...