US Patent Issued to Carl Zeiss MultiSEM on Dec. 9 for "Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distance" (German Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,343, issued on Dec. 9, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany).

"Multiple particle beam microscope and associated method with fast autofocus around an adjustable working distance" was invented by Dirk Zeidler (Oberkochen, Germany), Thomas Schmid (Aalen, Germany), Ingo Mueller (Aalen, Germany), Walter Pauls (Huettlingen, Germany) and Stefan Schubert (Oberkochen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multiple particle beam microscope and an associated method can provide a fast autofocus around an adjustable working distance. A system can have one or more fast autofocus correction lenses for adapting, in high-fr...