US Patent Issued to Carl Zeiss Microscopy on Nov. 25 for "Methods for creating a trench in a sample, and computer program product" (German Inventor)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,864, issued on Nov. 25, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Methods for creating a trench in a sample, and computer program product" was invented by Heiko Stegmann (Dresden, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for creating a trench with a defined intended trench depth in a sample uses a particle beam system configured to create a particle beam to ablate material from the sample. An exemplary method comprises: defining a particle beam system setting which is a setting of the particle beam system for implementing an ablation unit step with the particle beam; acquiring calibration data records using ...