US Patent Issued to Carl Zeiss Microscopy on May 13 for "Method for positioning objects in a particle beam microscope with the aid of a flexible particle beam barrier" (German, Polish Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,459, issued on May 13, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Method for positioning objects in a particle beam microscope with the aid of a flexible particle beam barrier" was invented by Josef Biberger (Wildenberg, Germany), Michal Postolski (Barlinek, Poland), Miriam Tabea Kaefer (Aalen, Germany) and Holger Ehm (Oberkochen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for positioning a movable object in a sample chamber of a particle beam microscope is carried out with the aid of a flexible particle beam barrier. The particle beam microscope comprises at least one particle beam column for producing a beam ...