ALEXANDRIA, Va., June 19 -- United States Patent no. 12,335,614, issued on June 17, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany).

"Method and device for determining the optimal position of the focal plane for examining a specimen by microscopy" was invented by Markus Sticker (Jena, Germany), Christoph Husemann (Jena, Germany) and Lutz Schaefer (Kitchener, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining the optimal position of the focal plane for examining a specimen by microscopy can include a) illuminating the specimen with light and recording images at different positions of the focal plane to provide a stack of intensity images, b) calculating a phase image fro...