US Patent Issued to Carl Zeiss Meditec on July 29 for "Method for controlling a semiconductor-laser-diode-based SS-interferometer system" (German, Austrian Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,462, issued on July 29, was assigned to Carl Zeiss Meditec AG (Jena, Germany).

"Method for controlling a semiconductor-laser-diode-based SS-interferometer system" was invented by Rainer Leitgeb (Vienna), Manfred Dick (Gefell, Germany), Roland Bergner (Jena, Germany), Ralf Ebersbach (Schmolln, Germany) and Thomas Pabst (Stadtroda, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), for a wide range of application suitable for use in ophthalmology, for example for imaging and for determining biometric measurement values of the eye. In a method acco...