ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,748, issued on June 17, was assigned to Carl Zeiss Industrielle Messtechnik GmbH (Oberkochen, Germany) and Carl Zeiss Microscopy GmbH (Jena, Germany).
"Industrial metrology of workpiece surface based on depth map" was invented by Tomas Aidukas (Brugg, Switzerland), Soren Schmidt (Jena, Germany) and Daniel Plohmann (Lauingen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for generating a depth map of a region of a surface of a workpiece includes receiving a stack of images. The images image the region of the surface of the workpiece with defined focal plane positions that are different in a depth direction and a focal plane position...