US Patent Issued to CANSEMI TECHNOLOGY on May 27 for "Leakage testing structure and leakage testing method" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,679, issued on May 27, was assigned to CANSEMI TECHNOLOGY INC. (Guangdong, China).

"Leakage testing structure and leakage testing method" was invented by Zeyong Chen (Guangdong, China) and Zhengliang Zhou (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electrical leakage test structure and an electrical leakage testing method are disclosed. The electrical leakage test structure comprises: a substrate; a first well region and a second well region, which are both formed in the substrate; a first shallow trench isolation structure formed between the second and first well regions; a first source/drain region formed in the first well ...