ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,491, issued on Nov. 11, was assigned to Canon K.K. (Tokyo).
"Inspection apparatus, and control method of inspection apparatus" was invented by Masaaki Muraishi (Chiba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a display control unit configured to display information on a display unit, a setting unit configured to set one or more areas including an object to be inspected, and an inspection unit configured to inspect data read from the object included in the one or more areas set by the setting unit. The display control unit displays a graphic to enable recognition of an upper limit of data to be inspected b...