ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,463, issued on May 13, was assigned to Canon K.K. (Tokyo).
"Inspection system and storage medium" was invented by Aihiko Numata (Tokyo), Takahiro Sato (Kanagawa, Japan) and Tatsuhito Goden (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "In an inspection system that uses terahertz waves, in order to improve the inspection precision for objects and the like, the inspection system has an illumination unit having a plurality of illumination elements that radiate terahertz waves; a camera unit that captures images of the terahertz waves that have been reflected off of an object that has been irradiated by the plurality of illumination elements; and...