ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,650, issued on July 29, was assigned to CANON K.K. (Tokyo).
"Inspection system and method for controlling the same, and storage medium" was invented by Hirotaka Seki (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system comprises a plurality of image capturing systems including a first image capturing unit, a first irradiation unit corresponding to the first image capturing unit, a second irradiation unit that does not correspond to the first image capturing unit but corresponds to a second image capturing unit and in which the irradiated terahertz waves are directly incident to the first image capturing unit, and a control unit...